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Wear compilation via CMM

Implant wear can be determined using a coordinate measuring machine (CMM, Mahr Multisensor MS 222, accuracy: ▒3 Ám). The machine records measuring points on the surface of the implant with a tactile sensor or a laser and creates a scatter plot. This scatter plot will be further analysed and compare to the original geometry using processing software (Imageware, UGS).

Wear will be determined as wear volume or linear wear.

This method may be used for wear analysis in simulator studies, however it is time consuming and therefore infrequently used. On the other hand, this method is highly useful for wear measurement on retrieved implant components. CMM is of particular importance for failure analysis or implant damage investigation.

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